examen
Surface Characterization Techniques Applied to ... - Springer LinkSurface Characterization Techniques Applied to ... - Springer Link
82.80.Gk. 73.50.Td. 68.55.Nq. 82.80.?d. 36.20.Hb. 68.35.Dv. Keywords:
Dielectric barrier discharge (DBD). Hydrogenated carbon nitride film (aH-CNx).
NMR ... the deposited film. The local structure of the amorphous aH-CNx film is
dominated by C?C and C?N single bonds i.e. carbon is mainly in the sp3
hybridized state.



2017 technical summaries - SPIE2017 technical summaries - SPIE
Mar 6, 2013 ... terials by spectral characteristics from UV (240 nm) to IR (14 ?m), mul- tispectral
image .... of alkylsilane monolayers on silicon nitride surfaces . ...... sion (XT) in a
scattering solid sample of layer thickness z0. A laser irradiates the sample with a
certain number of photons which migrate through the sample,.



Boundary lubrication of silicon nitride - NIST PageBoundary lubrication of silicon nitride - NIST Page
characteristics of the sample. The optical techniques have also developed,
chiefly by extending the spectrum into the ultraviolet and infrared regions and by
the introduction of lasers as sources. Some of these techniques can be applied to
particles in situ and thus have an important advantage over the vacuum
techniques.



IN IS?ETDE?INIS ?E TD E?INIS?ETD E - IAEA PublicationsIN IS?ETDE?INIS ?E TD E?INIS?ETD E - IAEA Publications
Aircrew Station Vision Requirements for Military. Aircraft. Lamp, Reflectors and
Associated Signaling. Equipment for Military Vehicles. Safety Standards for
Military Ground Vehicles. Markings, Functions and Hazard Designations of Hose,
. Pipe, and Tube lines for Aircraft, Missile and Space systems. Keyboard
Arrangements.



research report - International Atomic Energy Agencyresearch report - International Atomic Energy Agency
27 sept. 2006 ... [45] S. Oh, D. Suh and S. Lee, Microstructure of TiN / carbon steel functionally
gradient materials ... nitride and oxynitride layers produced under glow discharge
conditions, Surface and coatings .... P. Mengucci and A. Zocco, Characterization
of TiAlN films deposited by reactive pulsed laser ablation, Thin ...